© Copyright 2025 – Journal of King Saud University – Science.
Published by Scientific Scholar on behalf of King Saud University.
ISSN (Print): 1018-3647
ISSN (Online): 2213-686X
ORIGINAL ARTICLE
The effective carrier lifetime measurement in silicon: The conductivity modulation method
Volume 22 | Issue 1 | January 2010
Disclaimer:
This article was originally published by Elsevier and was migrated to Scientific Scholar after the change of Publisher.
This article was originally published by Elsevier and was migrated to Scientific Scholar after the change of Publisher.
